Open Access
Issue |
2015
17th International Congress of Metrology
|
|
---|---|---|
Article Number | 13004 | |
Number of page(s) | 6 | |
Section | Tendance en métrologie 3D / Trends in coordinate measurement | |
DOI | https://doi.org/10.1051/metrology/20150013004 | |
Published online | 21 September 2015 |
- T. Masuzawa, Y. Hamasaki, and M. Fujino, CIRP Annuals-Manufacturing Technology, 42(1), 589–592 (1993) [CrossRef] [Google Scholar]
- T. Masuzawa, B. J. Kim, C. Bergaud and M. Fujino, CIRP Annals-Manufacturing Technoogy., 46(1), 437–440 (1997) [CrossRef] [Google Scholar]
- B. J. Kim, T. Masuzawa and T. Bourouina, Meas. S ci. Technol., 10, 697–705 (1999) [CrossRef] [Google Scholar]
- A. Weckenmann, G. Peggs and J. Hoffmann, Meas. Sci. Technol., 17, 504–9 (2006) [CrossRef] [Google Scholar]
- B. Muralikrishnan, J. A. Stone, and J. R. Stoup, Precision Eng., 30(2), 154–164 (2006) [CrossRef] [Google Scholar]
- H. Schwenke, F. Wäldele, C. Weiskirch and H. Kunzmann, CIRP Annals-Manufacturing Technology, 50(1), 361–364 (2001) [CrossRef] [Google Scholar]
- H. Murakami, A. Katsuki, H. Onikura, T. Sajima, N. Kawagoishi and E. Kondo, J. of Advanced Mechanical Design, Systems, and Manufacturing, 4(5), 995–1004 (2010) [Google Scholar]
- J. Cui, L. Li and J. Tan, Meas. Sci. Technol., 23(8), 085105 (2012) [CrossRef] [Google Scholar]
- J. Cui, L. Li, J. Li and J. Tan, Sensors and Actuators A: Physical, 190, 13–18 (2013) [CrossRef] [Google Scholar]
- Y. Shimizu, B. Xu and W. Gao, Int. J. Nanomanufacturing, 8, 87–105 (2012) [CrossRef] [Google Scholar]
- F. G. Balzer, T. Hausotte, N. Dorozhovets, E. Manske and G. Jäger, Meas. Sci. Technol., 22(9), 094018 (2011) [CrossRef] [Google Scholar]
- K. Kiekens, F. Welkenhuyzen, Y. Tan, Ph. Bleys, A. Voet, J-P Kruth and W. Dewulf, Meas. Sci. Technol, 22, 115502 (2011) [CrossRef] [Google Scholar]
- M. Xu, J. Kirchhoff and U. Brand, Surf. Topogr. Metrol. Prop., 2(2), 024002 (2014) [CrossRef] [Google Scholar]
- ISO 9300:2005: Measurement of gas flow by means of critical flow Venturi nozzles. [Google Scholar]
- I. Behrens, L. Doering and E. Peiner, J. Micromech. Microeng., 13, 171–7 (2003) [CrossRef] [Google Scholar]
- E. Peiner, M. Balke, L. Doering, U. Brand, H. Bartu ch and S. Völlmeke, Proc. Mikrosystemtechnik Kon gress, 369–74 (2007) [Google Scholar]
- E. Peiner, M. Balke and L. Doering, IEEE Sensors Journal, 8, 1960–7 (2008) [CrossRef] [Google Scholar]
- E. Peiner, M. Balke, L. Doering and U. Brand, Meas. Sci. Technol., 19, 064001 (2008) [CrossRef] [Google Scholar]
- E. Peiner and L. Doering, IEEE Sens. J., 13(2), 701–8 (2013) [CrossRef] [Google Scholar]
- B. Mickan, R. Kramer and C. Li, 8th ISFFM, Colorado Springs, Colorado, USA, June 20–22 (2012) [Google Scholar]