Numéro |
2015
17th International Congress of Metrology
|
|
---|---|---|
Numéro d'article | 13003 | |
Nombre de pages | 21 | |
Section | Tendance en métrologie 3D / Trends in coordinate measurement | |
DOI | https://doi.org/10.1051/metrology/20150013003 | |
Publié en ligne | 21 septembre 2015 |
Metrological characterization of 3D imaging systems: progress report on standards developments
National Research Council Canada, Ottawa, Ont., Canada, K1A 0R6
a Corresponding author: angelo.beraldin@nrc-cnrc.gc.ca
A significant issue for companies or organizations integrating non-contact three-dimensional (3D) imaging systems into their production pipeline is deciding in which technology to invest. Quality non-contact 3D imaging systems typically involve a significant investment when considering the cost of equipment, training, software, and maintenance contracts over the functional lifetime of a given system or systems notwithstanding the requirements of the global nature of manufacturing activities. Numerous methods have been published to “help” users navigate the many products and specifications claims about “quality”. Moreover, the “best” system for one application may not be ideally suited for another application. The lack of publically-available characterization methods from trusted sources for certain areas of 3D imaging make it difficult for a typical user to select a system based on information written on a specification sheet alone. An internationally-recognized standard is a vehicle that allows better communication between users and manufacturers. It is in this context that we present a progress report on standards developments to date in the diverse, but finite, world of non-contact 3D imaging systems from the nanometre to the 100 m range.
© Owned by the authors, published by EDP Sciences, 2015
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.