Open Access
| Issue |
2019
19th International Congress of Metrology
|
|
|---|---|---|
| Article Number | 14001 | |
| Number of page(s) | 9 | |
| Section | SI, what’s next? / SI, et maintenant ? | |
| DOI | https://doi.org/10.1051/metrology/201914001 | |
| Published online | 23 September 2019 | |
- BIPM, https://www.bipm.org/en/cipm-mra/, June 2019. [Google Scholar]
- BIPM, https://www.bipm.org/en/bipm/physmet/, June 2019. [Google Scholar]
- CCEM, https://www.bipm.org/utils/en/pdf/si-mep/SI-App2-ampere.pdf, May 2019. [Google Scholar]
- K. Jones and A. C. Corney, Metrologia 24, 1-11 1987. [Google Scholar]
- B.P. Kibble and G.H. Rayner, Adam Hilger Ltd, Bristol, 1984. [Google Scholar]
- P Gournay, N. Fletcher, L. Robertson and M. Stock, CPEM Conf. Dig. 2016. [Google Scholar]
- BIPM, https://www.bipm.org/en/measurement-units/, June 2019. [Google Scholar]
- CODATA, https://physics.nist.gov/cgi-bin/cuu/Value?rk, June 2019. [Google Scholar]
- F. Delahaye and D. Bournaud, IEEE Trans. Instrum. and Meas., Vol. 42, nº2, 1993. [Google Scholar]
- F. Delahaye and R. Goebel, IEEE Trans. Instrum. and Meas., Vol. 54, nº2, 533, 2005. [CrossRef] [Google Scholar]
- J.A. Moreno and R. Hanke, CPEM Conf. Dig. 2000. [Google Scholar]
- W. G. Eicke and J. M. Cameron, Tech. note 430, NBS 1967. [Google Scholar]