Open Access
Issue
2015
17th International Congress of Metrology
Article Number 12009
Number of page(s) 5
Section Amélioration des références électriques / Improvement in electrical standards
DOI https://doi.org/10.1051/metrology/20150012009
Published online 21 September 2015
  • Cassiago C., La Paglia G, Pogliano U., IEEE Trans. Meas., 49. 6, pp. 1206–1210, (2000). [CrossRef]
  • Fluke Corporation, Calibration: Philosophy in Practice, Second Edition.
  • G. Rietveld, Artifact calibration: An evaluation of the Fluke 5700A series II calibrator, Rep. ISBN 90-9\0013\0322-4, (1999).
  • Capra P.P, Galliana F., arXiv: 15054398v 1 [physics.ins-det, (2015).
  • Oldham, N. ; Parker, M. Instrum. Meas. Tech. Conf., 1999. IMTC/99. Proceedings of the 16th IEEE Vol.: 3 DOI: 10.1109/IMTC.1999.776073 r: 1999, Page(s): 1485–1487 (1999).
  • Cassiago, C.; Callegaro, L.; La Paglia, G. Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE Volume: 1 DOI:, Page(s): 102–105 Vol.1, (2004). [CrossRef]
  • Galliana F., Capra P.P., Gasparotto E., Measurement. 45, 3, pp. 615–621, 2012). [CrossRef]
  • Galliana F., Gasparotto E., Measurement, 52; p. 64–70, (2014). [CrossRef]
  • Hamilton C.A. IEEE Trans. Instr. Meas.. 54, 1, pp. 215–221, (2005). [CrossRef]
  • Bosco GC., La Paglia G, Pogliano, U.and Zago G., in Proc. XIII IMEKO World Congr., Turin, Italy, pp.517–522, (1994).
  • Crisp P. B., MCSL Workshop and Symp., 1997, pp. 151–160, (1997).
  • JCGM 200, (2012).