Topical Metrology Problems in the Era of Cyber-physical Systems and Internet of Things
1 D.I.Mendeleyev Institute for Metrology, 190005 St.Petersburg, 19 Moskovsky pr., Russia
2 Omsk State Technical University, 644050 Omsk, 11 Mira av., Russia
* Corresponding author: email@example.com
The paper deals with metrological tasks conditioned by the coming technological revolution that is connected with the application of cyber-physical systems (CPSs) and Internet of Things (IoT). The need for terminology standardization in this field is shown and definitions of the main terms are proposed. CPSs and IoT can be economically efficient only in case of the transition to a qualitatively new level of metrological maintenance in the course of operation. It is necessary to abandon conventional methods of periodic calibrations. Topical metrology problems with regard to multi-channel systems including the necessity to check the reliability of measurement results automatically, are formulated. A number of examples demonstrate that to solve such problems it is possible to rely on the experience gained in the development of measuring systems with the metrological self-check and on the first national documentary standards in this field.
© The Authors, published by EDP Sciences, 2017
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