201316th International Congress of Metrology
|Number of page(s)||5|
|Section||Métrologie électrique / Electrical metrology|
|Published online||07 October 2013|
Caractérisation électromagnétique des matériaux pour des applications industrielles jusqu’à 110 GHz
1 Université Lille 1- Sciences et Technologies, Cité Scientifique 59655 Villeneuve d’Ascq cedex
2 Laboratoire National de métrologie et d’Essais, 29 avenue Roger Hennequin, 78197 Trappes cedex
The microelectronics industry through its development turns towards the miniaturization of devices in monolithic microwave circuits using broad frequency ranges. In order to perform these devices knowledge of the intrinsic properties of materials (permeability, permittivity) is required in most applications. There are different techniques for the extraction of these properties; The resonant methods: they exploit modes of a cavity loaded by a sample; and the non-resonant methods: They exploit a broadband characterization used for transmission lines.
In this paper we introduce a broadband characterization method based on the extraction of the coplanar waveguide (CPW) electromagnetic parameters (characteristic impedance, propagation constant, wafer permittivity, wafer permeability, …) from the measurement of a kit composed by 5 CPWs with known dimensions. Our analytic process allows too to get the uncertainty budget for each wafer electromagnetic parameters to ensure metrological traceability up to 110 GHz.
© Owned by the authors, published by EDP Sciences, 2013
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 2.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.