International Congress of Metrology

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Comparison of nanoparticle diameter measurements by Atomic Force Microscopy and Scanning Electron Microscopy

A. Delvallée, N. Feltin, S. Ducourtieux, M. Trabelsi and J-.F. Hochepied

Published online: 7 octobre 2013

DOI: 10.1051/metrology/201306007

A. Delvallée

N. Feltin

S. Ducourtieux

M. Trabelsi

J-.F. Hochepied

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