Low cost power and flow rates measurements for manufacturing plants
Anne Grau, Gilbert Schmitt, Frédéric Lecoche, Lionel Duvillaret, Gwenael Gaborit, Menad Bourkeb, Charles Joubert, Olivier Ondel, Hamed Yahoui, Riccardo Scorretti, Laurent Morel, Baya Hadid, Régis Ouvrard, Thierry Poinot, Erik Etien et Laurent Le Brusquet
International Congress of Metrology, (2013) 09001
DOI: https://doi.org/10.1051/metrology/201309001