Articles citing this article

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Cited article:

Enhanced geometrical parameters prediction in nanometrology: A hybrid metrology approach using AFM and SEM with an artificial neural network

Bixuan Huang, Xianmin Jin, Yangwen Li and Yiting Wu
ENGINEERING Mechanical Engineering 21 (2) (2026)
https://doi.org/10.1007/s11465-026-0881-7

Accuracy and reproducibility of ambient topographies at the nanoscale by AFM: Several months of metrological monitoring

Ziad Gharibeh, Maxime Leménager, Hind Bousbia, Rosine Coq Germanicus and J. Lopez
EPJ Web of Conferences 323 13001 (2025)
https://doi.org/10.1051/epjconf/202532313001