Open Access
| Numéro |
2013
16th International Congress of Metrology
|
|
|---|---|---|
| Numéro d'article | 13001 | |
| Nombre de pages | 4 | |
| Section | Nanotechnologies / Nanotechnology | |
| DOI | https://doi.org/10.1051/metrology/201313001 | |
| Publié en ligne | 7 octobre 2013 | |
- S. Hasegawa, I. Shiraki, F. Tanabe, R. Hobara, T. Kanagawa, T. Tanikawa, I. Matsuda, C. L. Petersen, T. M. Hansen, P. Boggild, F. Grey, Surf. Rev. Lett. 6, 963 (2003). [CrossRef] [Google Scholar]
- T. Kanagawa, R. Hobara, I. Matsuda, T. Tanikawa, A. Natori, S. Hasegawa, Phys. Rev. Lett. 91, 36805 (2003). [CrossRef] [PubMed] [Google Scholar]
- P. W. Sutter, J.-I. Flege, E.A. Sutter, Nature Materials 7, 406 (2008). [Google Scholar]
- T.-H. Kim, X.-G. Zhang, D. M. Nicholson, B. M. Evans, N. S. Kulkarni, B. Radhakrishnan, E. A. Kenik, A.-P. Li, Nano Lett. 10, 3096 (2010). [CrossRef] [PubMed] [Google Scholar]
- S.-H. Ji, J. B. Hannon, R. M. Tromp, V. Perebeinos, J. Tersoff, F. M. Ross, Nature Materials 11, 114 (2011). [CrossRef] [PubMed] [Google Scholar]
- Nanoprobe, Omicron Nanotechnology [Google Scholar]
- O. B. Shchekin, and D. G. Deppe, Appl. Phys. Lett. 80, 3277 (2002). [CrossRef] [Google Scholar]
- H. Lim, S. Tsao, W. Zhang, and M. Razeghi, Appl. Phys. Lett. 90, 131112 (2007). [CrossRef] [Google Scholar]
- J.B. Boos, W. Kruppa, B. R. Bennett, D. Park, S. W. Kirchoefer, R. Bass, and H. B. Dietrich, IEEE Trans. Electron Dev. 45, 1869 (1998). [CrossRef] [Google Scholar]
- B. R. Bennett, R. Magno, J. B. Boos, W. Kruppa, and M. G. Ancona, Solid-State Electron. 49, 1875 (2005). [CrossRef] [Google Scholar]
- A. Kiraz, P. Michler, C. Becher, B. Gayral, A. Imamoglu, L. Zhang, E. Hu, W. V. Schoenfeld, and P. M. Petroff, Appl. Phys. Lett. 78, 3932 (2001). [CrossRef] [Google Scholar]
- P. Caroff, M. E. Messing, B. M. Borg, K. A. Dick, K. Deppert, and L.-E. Wernersson, Nanotechnol. 20, 495606 (2009). [CrossRef] [Google Scholar]
- A. C. Ford, J. C. Ho, Y.-L. Chueh, Y.-C. Tseng, Z. Fan, J. Guo, J. Bokor and A. Javey, Nano Lett. 9, 360 (2009). [CrossRef] [PubMed] [Google Scholar]
- A. M. Katzenmeyer, F. Léonard, A. A. Talin, M. E. Toimil-Molares, and J. G. Cederberg, IEEE Trans. Nanotechnol. 10, 92 (2011). [CrossRef] [Google Scholar]
- T. Xu, J. P. Nys, A. Addad, O. I. Lebedev, A. Urbieta, B. Salhi, M. Berthe, B. Grandidier, D. Stiévenard Phys. Rev. B 81, 115403 (2010). [CrossRef] [Google Scholar]
- T. Xu, K. A. Dick, S. Plissard, T. H. Nguyen, Y. Makoudi, M. Berthe, J.-P. Nys, X. Wallart, B. Grandidier, P. Caroff, Nanotechnol. 23, 095702 (2012). [CrossRef] [Google Scholar]
- C. Durand, M. Berthe, Y. Makoudi, J.-P. Nys, R. Leturcq, P. Caroff, B. Grandidier, Nanotechnol. 24, 275706 (2013). [CrossRef] [Google Scholar]