| Numéro |
2015
17th International Congress of Metrology
|
|
|---|---|---|
| Numéro d'article | 14006 | |
| Nombre de pages | 5 | |
| Section | Nanotechnologie : mesure et caractérisation / Nanotechnology: measurement and characterisation | |
| DOI | https://doi.org/10.1051/metrology/20150014006 | |
| Publié en ligne | 21 septembre 2015 | |
Advances in measurement of interfacial chemical activity
National Physical Laboratory, Hampton Road, Teddington, TW11 0LW, United Kingdom
The latest developments in interfacial mapping at NPL using scanning electrochemical microscopy (SECM) are reviewed. A suite of electrochemical imaging techniques has been developed that enable the multiscale mapping of electroactivity at solid-liquid interfaces, as demonstrated by a number of applications. Micron- scale imaging reveals non-uniform activity distribution across model catalyst films and microarray screening provides a convenient approach to compare the performance of electrocatalyst and photoactive materials for emerging energy conversion technologies. Imaging at the nanoscale is achieved using hybrid techniques that combine SECM with atomic force microscopy (AFM) and scanning ion conductance microscopy (SICM). Advances are demonstrated by topographical-electrochemical mapping of graphene flakes and imaging oxygen reduction electroactivity at the single nanoparticle level.
© Owned by the authors, published by EDP Sciences, 2015
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.