Open Access
16th International Congress of Metrology
Article Number 11006
Number of page(s) 4
Section Métrologie électrique / Electrical metrology
Published online 07 October 2013
  • Fluke Corporation, Calibration: Philosophy in Practice, Second Edition. [Google Scholar]
  • G. Rietveld, “Artifact calibration: An evaluation of the Fluke 5700A series II calibrator ”, Rep. ISBN 90-9\ 013\ 322–4, (1999). [Google Scholar]
  • G. Rietveld, “Artifact calibration - The role of software in metrology ”, in Proceedings of the NCSL Workshop and Symposium, (1996). [Google Scholar]
  • T.J Witt, D. Reymann, D. Avrons, Proceedings of Prec. Electr. Measur. Conf. (CPEM), pp. 129–130, (1990). [Google Scholar]
  • B. Rolland, R. Goebel, N. Fletcher, Proceedings Prec. Electr. Measur. Conf. (CPEM), pp. 378–379, (2012). [Google Scholar]
  • Kwang-Min Yu, Mun-Seog Kim, Po Gyu Park ; Kyu-Tae Kim, “,Proceedings of Prec. Electr. Measur. Conf. (CPEM), pp. 629–630, (2010). [Google Scholar]
  • P.P. Capra, C. Cassiago, F. Galliana, M. Astrua Metrol. Meas. Syst. Vol. 16, No. 1, pp. 183–191, (2009). [Google Scholar]