201517th International Congress of Metrology
|Number of page(s)||7|
|Section||Nanotechnologie : mesure et caractérisation / Nanotechnology: measurement and characterisation|
|Published online||21 September 2015|
Metrology for Graphene and 2-D Materials
National Physical Laboratory, Hampton Road, Teddington, TW11 0LW, United Kingdom
Email corresponding author: email@example.com
The application of graphene, a one atom-thick honeycomb lattice of carbon atoms with superlative properties, such as electrical conductivity, thermal conductivity and strength, has already shown that it can be used to benefit metrology itself as a new quantum standard for resistance. However, there are many application areas where graphene and other 2-D materials, such as molybdenum disulphide (MoS2) and hexagonal boron nitride (h-BN), may be disruptive, areas such as flexible electronics, nanocomposites, sensing and energy storage. Applying metrology to the area of graphene is now paramount to enable the emerging global graphene industry and bridge the gap between academia and industry. Measurement capabilities and expertise in a wide range of scientific areas are required to address this challenge. The combined and complementary approach of varied characterisation methods for structural, chemical, electrical and other properties, will allow the real-world issues of commercialising graphene and other 2-D materials to be addressed. Here, examples of metrology challenges that have been overcome through a multi-technique approach are discussed. In addition, the role of international standardisation in this area is described, outlining the current work ongoing in both the International Organization of Standardization (ISO) and the International Electrotechnical Commission (IEC).
© Owned by the authors, published by EDP Sciences, 2015
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.