| Issue |
2013
16th International Congress of Metrology
|
|
|---|---|---|
| Article Number | 11001 | |
| Number of page(s) | 3 | |
| Section | Métrologie électrique / Electrical metrology | |
| DOI | https://doi.org/10.1051/metrology/201311001 | |
| Published online | 07 October 2013 | |
AIM QuTE: Automated Impedance Metrology extending the Quantum Toolbox for Electricity
1 Physikalisch-Technische Bundesanstalt, Bundesallee 100, D-38116 Braunschweig, Germany
2 Centro Español de Metrología, C/del Alfar 2, E-28760 Tres Cantos (Madrid), Spain
3 Cesky Metrologicky Institut, Okružní 31, CZ-638 00 Brno, Czech republic
4 METAS, Swiss Federal Office of Metrology, Lindenwe 50, CH-3003 Bern-Wabern, Switzerland
5 Istituto Nazionale di Ricerca Metrologica, Strada delle Cacce 91, IT-10135 Torino, Italy
6 Laboratoire National de Métrologie et d’Essais (LNE), 29 avenue Roger Hennequin, F-78197 Trappes Cedex, France
7 Główny Urząd Miar, ul. Elektoralna 2, 00-139 Warszawa, Poland
8 MIKES, Otakaari 7B, FIN-02150 Espoo, Finland
9 SP Technical Research Institute of Sweden, Box 857, SE-501 15 Borås, Sweden
10 Trescal A/S, Mads Clausens Vej 12, DK-8600 Silkeborg, Denmark
11 Turkiye Bilimsel ve Teknolojik Arastirma Kurumu, Ataturk Bulvari 221, TR-06100 Ankara, Turkey
12 esz AG calibration & metrology, Max-Planck-Strasse 16, D-82223 Eichenau, Germany
13 Politechnika Slaska, ul. Akademicka 10, 44-100 Gliwice, Poland
14 Uniwersytet Zielonogorski, ul. Podgórna 50, 65-246 Zielona Góra, Poland
a Corresponding author: luis.palafox@ptb.de
The “Automated impedance metrology extending the quantum toolbox for electricity” project (AIM QuTE) will extend Josephson impedance bridges capabilities to the whole complex plane with the best level of uncertainties (0.05 ppm). In parallel, fully digital bridges will be developed to reduce the operator workload imposed on national metrology institutes for the realisation of the impedances scales and for calibrations. The target level of uncertainty for these fully digital bridges is parts in 10−7. Furthermore, sub-pF standards will be developed to establish traceability of very small capacitances. An electronic impedance simulator, which will cover a very large region of the complex impedance plane, will also be realised, it will significantly reduce the number of standards required to link traceability of top level calibration laboratories to national metrology institutes.
© Owned by the authors, published by EDP Sciences, 2013
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 2.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.