22nd International Metrology Congress
A new metrology for a sustainable industry and society
March 11-14, 2025, Eurexpo Lyon, France
In partnership with GLOBAL INDUSTRIE
Congress description
The first International Metrology Congress (CIM) was organized in Bordeaux in 1983 by Pierre Barbier, a renowned metrology expert and founder of the Collège Français de Métrologie (CFM). The event was created to provide a platform for experts and practitioners in the field of metrology to exchange views on technical challenges, developments in standardization and emerging innovations.
The Congress was created in response to the increasing demand for standardization and international cooperation in measurement systems, particularly with the advent of technologies that require more accurate and globally consistent measurements. In its successive editions, CIM has attracted participants from around the world, including representatives from industry, academia and regulatory bodies, to share best practices and address global challenges in metrology.
Today, CIM is a premier biennial event that attracts hundreds of professionals who take advantage of the opportunity to interact with leading metrology experts.
This 22nd edition offers another dynamic 4-day program, featuring parallel sessions tackling global challenges. 100% in English, with over 200 presentations covering oral and poster sessions, along with round tables, workshops, a short course and a variety of social events, the CIM continues to be a hub of cutting-edge discussions and networking opportunities.
Oriano BOTTAUSCIO - INRIM / Italy
Maguelonne CHAMBON - LNE / France
Cosimi CORLETO - STIL Marposs / France
Jean-Pascal DE CASANOVE - SAFRAN / France
Dolores DEL CAMPO - CEM / Spain
Miruna DOBRÉ - FPS ECONOMY / Belgium
Anthony DONNELLAN - OIML / International
Christina DRAGHICI - ISO / Switzerland
Sascha EICHSTAEDT - PTB / Germany
Mustapha EL BOUCHOUAFI - ZEISS / France
Nicolas FISCHER - LNE / France
Eric GEORGIN - CETIAT / France
Barbara GOLDSTEIN - NIST / USA
Stéphane GUEU - ESSILOR LUXOTTICA / France
JT JANSSEN - NPL / United Kingdom
Sami KOSKINEN - BEAMEX / Finland
Sebastien LABORDE - COFRAC / France
Hugo LEHMANN - METAS / Switzerland
Pete LOFTUS - EVALU8TION / United Kingdom
Maureen LOGGHE - EA / Belgium
Laura MARTIN - EUROLAB / Belgium
Temmu NAYKKI - FINNISH ENV. INSTITUTE / Finland
Jessica QUERON - INERIS / France
Anne TRUMPFHELLER - EURAMET / Germany
Valentijn VAN MISPELAAR - SHELL / The Netherlands
David VASTY - TRESCAL / France
Alexandra ALLARD - IFREMER /France
Fredrik ARRHEN - RISE / Sweden
Annarita BALDAN - VSL / The Netherlands
Elsa BATISTA - IPQ / Portugal
David BENHAMOU - CT2M / France
Harald BOSSE - PTB / Germany
Oriano BOTTAUSCIO - INRIM / Italy
Oliver BÜKER - RISE / Sweden
Isabelle CARE - CETIAT / France
Thierry COOREVITS - ENSAM / France
Ivo DEGIOVANNI - INRIM / Italy
Dolores DEL CAMPO - CEM / Spain
Alex DEXTER - NPL / UK
Florbela DIAS - IPQ / Portugal
Miruna DOBRÉ - FPS ECONOMY / Belgium
Jean-Remy FILTZ - LNE / France
Nicolas FISCHER - LNE / France
Pierre GOURNAY - BIPM / International
Alain GUERDAT - ROLEX / Switzerland
François HENNEBELLE - UNIV. DE BOURGOGNE / France
JT JANSSEN - NPL / United Kingdom
Stephan KUECK - PTB / Germany
Mark KUSTER - NCSLI / USA
Bernard LARQUIER - BEA METROLOGIE / France
Richard LUXTON - IBST / United Kingdom
Marco Carlo MASOERO - POLITECNICO DI TORINO / Italy
Kruno MILICEVIC - RANDOM RED / Croatia
Jasmine PETRY - NESTLE / Switzerland
Gert RIETVELD - VSL / The Netherlands
Andrea Mario ROSSI - INRIM / Italy
Max RYADNOV - NPL / United Kingdom
Michela SEGA - INRIM / Italy
David VASTY - TRESCAL / France
