International Congress of Metrology

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Nanoscale Transport Measurements with Multiple Probe Scanning Tunneling Microscopy

M. Berthe, C. Durand, R. Leturcq and B. Grandidier

Published online: 7 octobre 2013

DOI: 10.1051/metrology/201313001

M. Berthe

C. Durand

R. Leturcq

B. Grandidier

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