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Metrology to underpin future regulation of industrial emissions

Anne Rausch, Olav Werhahn, Oliver Witzel, Volker Ebert, Edgar Moreno Vuelban, Jan Gersl, Gjermund Kvernmo, John Korsman, Marc Coleman, Tom Gardiner et Rod Robinson

International Congress of Metrology, (2015) 07008

DOI: https://doi.org/10.1051/metrology/20150007008

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