International Congress of Metrology

Characterisation and Measurement to the Sub-Micron Scale of a Reference Wire Position

Claude Sanz, Ahmed Cherif, Hélène Mainaud Durand, Paul Morantz and Paul Shore

Published online: 21 September 2015

DOI: 10.1051/metrology/20150013005

Claude Sanz

Ahmed Cherif

Hélène Mainaud Durand

Paul Morantz

Paul Shore

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