International Congress of Metrology

Comment étalonner et configurer efficacement les instruments intelligents et réussir à documenter ces données

Alex Maxfield, Heikki Laurila and Christophe Boubay

Published online: 21 September 2015

DOI: 10.1051/metrology/20150012004

Alex Maxfield

Heikki Laurila

Christophe Boubay

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