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Cited article:

Development of a compact focus variation microscopy sensor for on-machine surface topography measurement

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Measurement 187 110311 (2022)
https://doi.org/10.1016/j.measurement.2021.110311

Analysis of Measurement Accuracy of Multi-Objective Normalization Algorithm Under Different Reference Systems

Si-Liang Li, Hai-Jiang Liu, Ze-Yu Xu and Jin-Song Liu
IEEE Access 9 86661 (2021)
https://doi.org/10.1109/ACCESS.2021.3088274

Performance Evaluation of a Robot-Mounted Interferometer for an Industrial Environment

Istvan Biro and Peter Kinnell
Sensors 20 (1) 257 (2020)
https://doi.org/10.3390/s20010257