International Congress of Metrology

Designing coupled coplanar waveguide standards for on-wafer mixed-mode S-parameter measurement

Thi Dao Pham, Djamel Allal, François Ziadé and Eric Bergeault

Published online: 18 September 2017

DOI: 10.1051/metrology/201707009

Thi Dao Pham

Djamel Allal

François Ziadé

Eric Bergeault

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