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Metrology to underpin future regulation of industrial emissions

Anne Rausch, Olav Werhahn, Oliver Witzel, Volker Ebert, Edgar Moreno Vuelban, Jan Gersl, Gjermund Kvernmo, John Korsman, Marc Coleman, Tom Gardiner and Rod Robinson

Published online: 21 September 2015

DOI: 10.1051/metrology/20150007008

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