International Congress of Metrology

EDPS Account

Search

Menu

Search

Deux ans d’expérience du club nanoMétrologie

F. Piquemal, K. Aguir, D. Bernard, V. Cappronnier, J. Carimalo, D. Chambonnet, Y. De Wilde, S. Ducourtieux, G. Favre, N. Feltin et al. (8 more)

Published online: 07 October 2013

DOI: 10.1051/metrology/201313002

F. Piquemal

K. Aguir

D. Bernard

V. Cappronnier

J. Carimalo

D. Chambonnet

Y. De Wilde

S. Ducourtieux

G. Favre

N. Feltin

B. Gautier

P. Gournay

P. Lambert

A. Levenson

G. Louarn

T. Macé

J.M. Moschetta

B. Poyet

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)

Copyright / Published by: EDP Sciences