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Influence of low temperature annealing on Nickel RTDs designed for heat flux sensing

Youssef Mokadem, Sylvie Bégot, François Lanzetta, Jean-Yves Rauch, Aymen Zribi, Virginie Moutarlier and Magali Barthès

International Congress of Metrology, (2019) 18007

DOI: https://doi.org/10.1051/metrology/201918007

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