Open Access
| Issue |
EPJ Web of Conferences
Volume 77, 2014
16th International Congress of Metrology
|
|
|---|---|---|
| Article Number | 00004 | |
| Number of page(s) | 4 | |
| DOI | https://doi.org/10.1051/epjconf/20147700004 | |
| Published online | 19 August 2014 | |
- Draft Chapter 2 for SI Brochure, following redefinitions of the base units (2010); http://www.bipm.org/utils/common/pdf/si_brochure_draft_ch2.pdf [Google Scholar]
- Mise en pratique for the ampere and other electric units in the International System of Units (SI), CCEM/09-05, Note to the reader and Point 4, (2009); http://www.bipm.org/cc/CCEM/Allowed/26/CCEM-09-05.pdf [Google Scholar]
- iMERA Plus Joint Research Project “REUNIAM”, Grant Agreement No. 217257, final report (2011) [Google Scholar]
- J. P. Pekola, O.-P. Saira, V. F. Maisi et al., Rev. Mod. Phys. 85, 1421 (2013) [CrossRef] [Google Scholar]
- European Joint Research Project Quantum ampere: Realisation of the new SI ampere (Qu-Ampere, JRP number SIB07; http://www.ptb.de/emrp/868.html [Google Scholar]
- M. D. Blumenthal, B. Kaestner, L. Li et al., Nat. Phys. 3, 343 (2007) [CrossRef] [Google Scholar]
- B. Kaestner, V. Kashcheyevs, S. Amakawa et al., Phys. Rev. B 77, 153301 (2008) [CrossRef] [Google Scholar]
- B. Kaestner, V. Kashcheyevs, G. Hein et al., Appl. Phys. Lett. 92, 192106 (2008) [CrossRef] [Google Scholar]
- L. Fricke, F. Hohls, N. Ubbelohde et al., Phys. Rev. B 83, 193306 (2011) [CrossRef] [Google Scholar]
- S. P. Giblin, M. Kataoka, J.D. Fletcher et al., Nat. Comm. 3, 930 (2012) [CrossRef] [Google Scholar]
- J. P. Pekola, J. J. Vartiainen, M. Möttönen et al., Nat. Phys. 4, 120 (2008) [CrossRef] [Google Scholar]
- D. V. Averin, J. P. Pekola, Phys. Rev. Lett. 101, 066801 (2008) [CrossRef] [PubMed] [Google Scholar]
- A. Kemppinen, S. Kafanov, Y. A. Pashkin et al., Appl. Phys. Lett. 94, 172108 (2009) [CrossRef] [Google Scholar]
- M. Pierre, B. Roche, X. Jehl et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2010, 755 (2010) [Google Scholar]
- L. Fricke, M. Wulf, B. Kaestner et al., Phys. Rev. Lett. 110, 126803 (2013) [CrossRef] [PubMed] [Google Scholar]
- L. Fricke, M. Wulf, B. Kaestner et al., arXiv:1312.5669v1 (2013), to be published [Google Scholar]
- B. Kaestner, C. Leicht, F. Hohls et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 706 (2012) [Google Scholar]
- M. Wulf, L. Fricke, F. Hohls et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 246 (2012) [Google Scholar]
- S. P. Giblin, M. Kataoka, J. Fletcher et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 710 (2012) [Google Scholar]
- V. F. Maisi, O.-P. Saira, A. Kemppinen et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 248 (2012) [Google Scholar]
- X. Jehl, B. Roche, M. Sanquer et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 250 (2012) [Google Scholar]
- M. Wulf, Phys. Rev. B 87, 035312 (2013) [CrossRef] [Google Scholar]
- X. Jehl, B. Voisin, T. Charron et al., Phys. Rev. X 3, 021012 (2013) [Google Scholar]
- X. Jehl et al., in Conference Proceedings of Métrologie 2013 International Congress of Metrology (2013) [Google Scholar]
- M. Götz, E. Pesel, D. Drung for publication in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2014 International Congress of Metrology (2014) [Google Scholar]
- B Steck, A. Gonzalez-Cano, N. Feltin et al., Metrologia 45, 482 (2008) [CrossRef] [Google Scholar]
- F. Rengnez, O. Séron, L. Devoille et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 150 (2012) [Google Scholar]
- L. Devoille, N. Feltin, B. Steck et al., Meas. Sci. Technol. 23, 124011 (2012) [CrossRef] [Google Scholar]
- F. Rengnez, O. Séron, L. Devoille et al., in Conference Proceedings of Métrologie 2013 International Congress of Metrology (2013) [Google Scholar]
- H. Scherer, S. P. Giblin, X. Jehl et al., in Conference Proceedings of Métrologie 2013 International Congress of Metrology (2013) [Google Scholar]
- D. Drung, C. Krause, U. Becker et al., for publication in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2014 International Congress of Metrology (2014) [Google Scholar]