Open Access
Issue
2013
16th International Congress of Metrology
Article Number 06007
Number of page(s) 6
Section Les avancées en mesure 3D et Dimensionnel / Advanced coordinate metrology & Dimensional
DOI http://dx.doi.org/10.1051/metrology/201306007
Published online 07 October 2013
  • Binnig G, Quate C F, Gerber C, “Atomic force microscopy”, 1986, Phys. Rev. Lett. 56 930–934. [CrossRef] [PubMed]
  • Klein T..,Buhr E.., Johnsen K-P.., Frase C.G..,“Traceable measurement of nanoparticle size using a scanning electron microscope in transmission mode (TSEM)”, 2011, Meas. Sci. Technol., 22 94002. [CrossRef]
  • Huang Y.., Pemberton J.E.., «Synthesis of uniform, spherical sub- 100 nm silica particles using a conceptual modification of the classic LaMer model » , 2010, Colloids and Surfaces A: Physicochem. Eng. Aspects, 360 175–183. [CrossRef]
  • Nam Woong Song and al., “Uncertianty estimation of NP size distribution from a finite number data obtained by microscopic analysis”, 2009, Metrologia, 46 480–488.